Two-Step Kirkpatrick–Baez System: Compact Optics for X-ray Microfocusing
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概要
- 論文の詳細を見る
A design concept is presented for a compact X-ray microfocusing system, which consists of two sets of Kirkpatrick–Baez (K–B) optics and intermediate slits. The proposed optics enables us to achieve a high demagnification factor, while the total length of the optics is relatively small. Ray-tracing simulations demonstrate that a spot size comparable to that of a conventional K–B optics is achieved using the two-step K–B microfocusing system with much shorter optics, keeping the same working distance. Preliminary results from a prototype system are also reported. A 3.3 μm spot was obtained after a proper alignment, which agrees well with the expected spot size.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-06-15
著者
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Amemiya Kenta
Institute Of Materials Structure Science Kek
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Amemiya Kenta
Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan
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Miyawaki Jun
Department of Chemistry, Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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Abe Hitoshi
Department of Chemistry, Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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Sako Erika
Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan
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- Two-Step Kirkpatrick–Baez System: Compact Optics for X-ray Microfocusing