Verification of Validity of Approximated Vector Diffraction Model

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概要

• 論文の詳細を見る

• The validity of an approximated vector diffraction model was studied for an optical-disk readout system by comparing the results with those obtained by a rigorous calculation model. It was confirmed that the approximation model provides useful information for sidewall angles up to about 40°.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2006-02-15

著者

• Honguh Yoshinori

  Corporate R & D Center Toshiba Corporation

• Honguh Yoshinori

  Corporate Research and Development Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan

関連論文

• Detection of Label Area by Comb-Shaped Illumination
• Verification of Validity of Approximated Vector Diffraction Model

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