Phase-Shifting X-Ray Shearing Interferometer

概要

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We propose an X-ray shearing interferometer, where two slightly sheared X-ray beams are produced, both of which are transmitted through an object. The two beams are superposed and interfere after they are transmitted through the interferometer. The interfered beams show intensity variation due to the phase difference between the sheared beams. To measure the phase difference, the phase-shift method is introduced. To obtain the phase shift, an acrylic wedge is rotated. This interferometer is constructed by monolithical cutting from a single silicon crystal. The phase difference distribution along a line is obtained by detecting the X-ray intensity at a point and scanning the objects mechanically. Some simple objects made of acrylic resin are measured with good contrast, showing the validity of the interferometer.
INSTITUTE OF PURE AND APPLIED PHYSICSの論文
1999-11-15