Segregated Microstructure and Crystal Structure in Sputter-Deposited Co–Cr Carbon-Added Films

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概要

• 論文の詳細を見る

• The compositionally segregated microstructure and the crystal structure of sputter-deposited Co–Cr films to which various percentages of carbon were added are studied by transmission electron microscopy. The results are as follows: (1) The degree of segregation in the microstructure increases as amount of carbon added increases. The segregated pattern is changed by the amount of carbon added. (2) The saturation magnetization increases as the degree of the segregation increases. The perpendicular coercivity depends on the perpendicular magnetic anisotropy, and magnetic anisotropy is related to the degree of segregation and the refinement of the segregated pattern. (3) The plane defects perpendicular to the $C$-axis in sputter-deposited Co–Cr films are grown by carbon addition.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 1989-03-20

著者

• AWANO Haruo

  Sony Corporation Information Systems Research Center

• Masuya Haruko

  Sony Corporation Research Center, 174 Fujitsukacho, Hodogayaku, Yokohama 240

関連論文

• Improved Characteristics of p^+-n Junctions formed by Excimer Laser Annealing with Low Temperature Pre-Annealing
• Effect of Argon lon Bombardment on Internal Stress in Evaporated Co-Cr Film : Magnetism, Magnetic Materials and Devices
• Segregated Microstructure and Crystal Structure in Sputter-Deposited Co–Cr Carbon-Added Films

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