Calculation of Noise Intensity in the Frequency Demodulation for Atomic Force Microscopy
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概要
- 論文の詳細を見る
Noise intensity in the resonance frequency shift ($\Delta f$) signal of the cantilever oscillation, which is an indirect measure of force in non-contact atomic force microscopy, was calculated and compared with those measured experimentally. It is found that the output noise amplitude is proportional to the ratio of noise to the oscillation amplitude measured at the input of the frequency demodulator. Our analysis indicates that improving the sensitivity to cantilever deflection can reduce the noise in the $\Delta f$ signal.
- Japan Society of Applied Physicsの論文
- 2004-02-15
著者
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Ono Masanori
The Institute For Solid State Physics The University Of Tokyo
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An Toshu
The Institute For Solid State Physics The University Of Tokyo
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Hasegawa Yukio
The Institute For Solid State Physics The University Of Tokyo
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Eguchi Toyoaki
The Institute For Solid State Physics The University Of Tokyo
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SAKURAI Toshio
The Institute for Solid State Physics, The University of Tokyo
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Akiyama Kotone
The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan
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Sakurai Toshio
The Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577, Japan
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