Kelvin Probe Force Microscopy of Defects in ZnO Nanocrystals Associated with Emission at 3.31 eV
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概要
- 論文の詳細を見る
The surface potential variations on ZnO nanocrystal surfaces were investigated by using Kelvin probe force microscopy. It was found that the nanocrystal surface contains randomly distributed circular pits with a diameter of ${\sim}100$ nm and a depth of ${\sim}30$ nm and that the surface potential within the pits is lower than that in the vicinity of the pits. We discuss the correlation between the observed pits and speck-like defects on a ZnO nanocrystal surface associated with the emission at 3.31 eV. We suggest that the reduced surface potential is caused by the local acceptor-like states concentrated near the structural defects.
- 2011-02-25
著者
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Kang Tae
Quantum Functional Semiconductor Research Center Dongguk University
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Kang Tae
Quantum-functional Semiconductor Research Center, Dongguk University-Seoul, Seoul 100715, Korea
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Yang Woo
Quantum-functional Semiconductor Research Center, Dongguk University-Seoul, Seoul 100715, Korea
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Kurbanov Saidislam
Quantum-functional Semiconductor Research Center, Dongguk University-Seoul, Seoul 100715, Korea
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Kurbanov Saidislam
Quantum-functional Semiconductor Research Center, Dongguk University, Seoul 100-715, Korea
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