Evaluation Method of Screen Mottle and Some Affecting Factors
スポンサーリンク
概要
- 論文の詳細を見る
In order to analyze relationships between screen mottle ad fundamental screen components, we introduce the average value of the wiener spectra which are calculated in the range from 0 to 0.5 cycles/mm. And we express its value WS(∼0.5).<BR>By using the WS(∼0.5), we analyze relationship between screen mottle and the thicknesses of protective layer and phosphor layer of internsifying screens. Both of the increases of those thicknesses cause the reductions of sharpness. But the elects on the granularity are different. The increase of protective layer reduces the WS(∼0.5), but the increase of phosphor layer does not reduce the WS(∼0.5).
- Medical Imaging and Information Sciencesの論文
Medical Imaging and Information Sciences | 論文
- 系列依存性による2次元画像の解析およびその周辺
- 小型X線マイクロビームスキャナによるディジタル画像
- EMIスキヤン像のデータ処理-アナログメモリを用いた多重ウィンドウ表示と多重スライス表示-
- RadiographにおけるGraininessとSharpnessの検討
- X線用イメジインテンシファイアの雑音について