A Comparative Thermometric Study of Four Semiconductor Laser Devices
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概要
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A thermometric study was conducted on two experimental (Trial device and Panals 1000; National/Panasonic) and two commercially available (Semilaser Nanox LX-801; G.C. Co. and Trinpl D; Yoshida) semiconductor lasers. This study was carried out in order to verify whether or not these laser types produce any substantial amount of heating during its application on tooth structure. Temperature measurements were done in vitro, using a thermal camera (Thermovision 870; AGEMA) and a thermocouple sensor (Hi-temperature tester). Maximum temperature elevations were recorded during a 60,120, and 180 second laser exposure. Results showed that factors such as exposure time, power level and operation mode of the laser device, influenced the thermal effects during irradiation. Although the semiconductor laser devices evaluated demonstrated thermal effects, the intrapulpal temperature elevation was not sufficient to cause pulp al damage in vivo.
- 昭和大学・昭和歯学会の論文
昭和大学・昭和歯学会 | 論文
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