Partial Inspection and 2-color CT Material Analysis with 950kev/3.95Mev X-Band Linac
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概要
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Application of portable 950keV/3.95Mev X-band linac to NDE of bridges, NPPs and architectures is studied with consideration of partial CT. Filtered Back Projection is adopted as reconstruction algorithm after comparison with other methods for fast computation and better material resolution. Material component analysis would also be implemented based on 2-color CT.
- 一般社団法人 日本原子力学会の論文
一般社団法人 日本原子力学会 | 論文
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