ZnO樹脂分散層の表面光起電力
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概要
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The zinc oxide-resin photoconductive layers are prepared as follows; zinc oxide powder with crystal size of about 0. 1 to 0. 7 microns is dispersed in toluene solution of Silicone, Alkyd and Polyolefin resins and this mixture is then poured onto aluminum base plates and dried immediately.<br/>The thickness of these layers are between 15 and 25 microns.<br/>The surface voltage of the layer under dark adaptation (contact potential difference between sample and electrode) and the surface photovoltage under the illumination of white light (variation of contact potential difference) are measured by the Kelvin method.<br/>The large fast and slow photovoltages are observed under the illumination of white light. The rise up time constant of fast photovoltage is about 0. 5 second and that of slow photovoltage is a few minutes or longer. The contact potential difference and the surface photovoltage are changed with zinc oxidP content of the layer. The dark decay curve of surface phototovoltage is approximately shown in the form of Vph=Vophexp(−t/τ) where Voph is the inital surface photovoltage after the illumination, τD is recovery time of surface photovoltage which depends on zinc oxide content. The observed value of r:n is about 20 minutes in the case of zinc oxide-silicone resin layer and longer than an hour in the case of other layers. The observed value of τD is associated with fatigue by pre-illumination on electrophotographic properties. The thickness and light intensity dependence of the surface photovoltage are measured.
- The Imaging Society of Japanの論文
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