Composition dependency of crystal structure, electrical and piezoelectric properties for hydrothermally-synthesized 3 µm-thickness (KxNa1−x)NbO3 films
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Epitaxial (KxNa1−x)NbO3 films with 3 µm in thickness were deposited at 240°C on (100)cSrRuO3//(100)SrTiO3 substrates by hydrothermal method. XRD patterns and Raman spectra were systematically changed with increasing x values. XRD patterns and Raman spectra was not dramatically changed by the annealing treatment at 600°C for 10 min under O2 atmosphere. On the other hand, the electrical and piezoelectric properties were improved by this annealing treatment; leakage current density was diminished and longitudinal piezoelectric response was increased to 69 pm/V at x = 0.51.
- 公益社団法人 日本セラミックス協会の論文
公益社団法人 日本セラミックス協会 | 論文
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