Stereomicrophotogrammetry by Scanning Electron Microscope
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概要
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A pair of stereomicrographs of a specimen has been taken through a scanning electron microscope. The measured profiles of the specimen obtained by analysing the pair is in a good agreement with its actual profiles. Contour maps of specimens have been obtained by the use of Autograph A 7. A theoretical discussion is made on the error in the height measurement.
- 社団法人 日本写真測量学会の論文
社団法人 日本写真測量学会 | 論文
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