Determination of Cation Distribution in ZnFe2O4, NiFe2O4 and NiAl2O4 Spinels by An In-house Anomalous X-ray Scattering Method.:An In-house Anomalous X-ray Scattering Method
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概要
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An in-house anomalous X-ray scatterig (AXS) method has been done for determiningcation distribution in ZnFe<SUB>2</SUB>O<SUB>4</SUB>, NiFe<SUB>2</SUB>O<SUB>4</SUB> and NiAl<SUB>2</SUB>O<SUB>4</SUB> spinels using the anomalous dispersion effect near the K absorption edges of Zn and Ni. When introduced the ratio (<SUB>x</SUB>) of the number of divalent cations of M element, M<SUB>A</SUB>, residing in the tetrahedral A-site to the total number of M element, <I>x</I>=M<SUB>A</SUB>/M<SUB>total</SUB>, the measured intensity ratios of three reflection peaks with two energies close to the <I>K</I> edge of Zn or Ni can be quantitatively explained only by assigning the case where ZnFe<SUB>2</SUB>O<SUB>4</SUB> is the normal type (<I>x</I>=1.0) and NiFe<SUB>2</SUB>O<SUB>4</SUB> is the inverse type (<SUB>x</SUB>=0.0) spinel structure. On the other hand, the results for NiAl<SUB>2</SUB>O<SUB>4</SUB> suggests that 15% of Ni<SUP>2+</SUP> cations occupy the tetrahedral A-site (<I>x</I>=0.15) and the rest are octahedrally coordinated. The usefulness of the in-house AXS method is rather surprisingly well-recognized, particularly for obtaining the cation distribution in crystalline materials containing two elements of nearly the same atomic number.
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