Applications of orientation imaging microscopy to quantitative analysis of grain boundary microstructures and grain boundary engineering
スポンサーリンク
概要
公益社団法人 日本顕微鏡学会 | 論文
- 13th International Congress on Electron Microscopy
- Cathodoluminescence Detection System for Transmission Electron Microscope.
- Investigation of elemental distribution in a dielectric of DRAM.
- Coherent Bremsstrahlung Peaks in EDS Spectra
- Nanobiology of DNA