X-ray diffractometric measurement of lattice misfit between .GAMMA. and .GAMMA.' phase in Ni-base superalloys.

概要

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The lattice misfits between γ and γ' phase in single crystal Ni-base superalloys were accurately measured for filings of specimens by X-ray diffractometry combined with the deconvolution method. The (331) reflection peaks measured with a conventional X-ray diractometer were in a cluster of overlapping peaks because of the very small differences in the lattice parameters of both phases and the instrumental broadening due to X-ray optics including the spectral distribution of X-ray source such as CuKα doublet.The deconvolution method was applied to remove the instrumental broadening from the (331) peaks measured with the conventional diffractometer. The instrumental window function, which is the most important factor for separation of the instrumental broadening and is necessary for the unfolding of clustered peaks, was calculated from (533) CuKα doublet reflection of Si standard by a non-linear least square method. The cluster of peaks was separated into individual peaks without previous knowledge of the number of peaks by the deconvolution with the instrumental window function and then the misfits between γ and γ' phase of specimens were accurately determined. Therefore, this method was a powerful tool for the measurement of the lattice misfit between γ and γ' phase in single crystal superalloys.
The Iron and Steel Institute of Japanの論文