Applications of X-ray thin film diffraction method.
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概要
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A new type thin-film goniometer method is capable of obtaining increased reflection intensities to measure quantitatively the reflection lines from Si thin films, Fe films on glass plates, and surface oxide-films on stainless steels, which can not be detected by the conventional θ-2θ method. Formation of FeCr2O4 film on 304 stainless steels is found to be dependent on the dew point temperatures of annealing atmosphere.
- The Iron and Steel Institute of Japanの論文
The Iron and Steel Institute of Japan | 論文
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