A Novel Pattern Run-Length Coding Method for Test Data Compression

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概要

• 論文の詳細を見る

• This paper presents a novel data compression method for testing integrated circuits within the framework of pattern run-length coding. The test set is firstly divided into 2n-length patterns where n is a natural number. Then the compatibility of each pattern, which can be an external type, or an internal type, is analyzed. At last, the codeword of each pattern is generated according to its analysis result. Experimental results for large ISCAS89 benchmarks show that the proposed method can obtain a higher compression ratio than existing ones.

• The Institute of Electronics, Information and Communication Engineersの論文

著者

• Hao Chengpeng

  Institute Of Acoustics Chinese Academy Of Sciences

• LIU Yu

  Institute of Acoustics, Chinese Academy of Sciences

• WU Diancheng

  Institute of Acoustics, Chinese Academy of Sciences

• ZHU Hao

  Institute of Acoustics, Chinese Academy of Sciences

• WANG Donghui

  Institute of Acoustics, Chinese Academy of Sciences

• HAO Chengpeng

  Institute of Acoustics, Chinese Academy of Sciences

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• A Novel Pattern Run-Length Coding Method for Test Data Compression

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