High-Bitrate-Measurement-System-Oriented Lower-Jitter 113-Gbit/s 2:1 Multiplexer and 1:2 Demultiplexer Modules Using 1-µm InP/InGaAs/InP Double Heterojunction Bipolar Transistors

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概要

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• We fabricated low-jitter 2:1 multiplexer (MUX) and 1:2 demultiplexer (DEMUX) modules for bit error rate testers that can be used for research into ultra-high-bitrate communication subsystems and devices with bitrates of over 100Gbit/s. The 1:2 DEMUX IC design took into consideration an IC layout allowing module pin placement for optimal utility. With regard to mounting, the 2:1 MUX and 1:2 DEMUX modules were constructed using transmission lines of grounded coplanar waveguide (G-CPW) configuration, which offers excellent high-frequency characteristics. These modules operated at 113Gbit/s with a low root mean square jitter of 548fs and 587fs, respectively.

著者

• Matsuoka Yutaka

  Anritsu Devices

• ARAYASHIKI Yutaka

  Anritsu Devices

• OHKUBO Yukio

  Anritsu Devices

• MATSUMOTO Taisuke

  Anritsu Devices

• AMANO Yoshiaki

  Anritsu Devices

• KAMIZONO Takashi

  Anritsu Devices

関連論文

• A 120-Gbit/s 1.27-W 520-mVpp 2:1 Multiplexer IC Using Self-Aligned InP/InGaAs/InP DHBTs with Emitter Mesa Passivation
• High-Bitrate-Measurement-System-Oriented Lower-Jitter 113-Gbit/s 2:1 Multiplexer and 1:2 Demultiplexer Modules Using 1-µm InP/InGaAs/InP Double Heterojunction Bipolar Transistors

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