Soft X-Ray Imaging Design and Analysis Methods on DIII-D
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概要
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A new tangential 2D Soft X-Ray Imaging System (SXRIS) is being designed to examine the edge magnetic island structure in the lower X-point region of DIII-D. A synthetic diagnostic calculation coupled to 3D emissivity estimates is used to generate phantom images. Phillips-Tikhonov regularization is used to invert the phantom images for comparison to the original emissivity model. Noise level, island size, and equilibrium accuracy are scanned to assess the feasibility of detecting edge island structures. Models of typical DIII-D discharges indicate integration times > 1 ms with accurate equilibrium reconstruction are needed for small island (< 3 cm) detection.
- 社団法人 プラズマ・核融合学会の論文
著者
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HARRIS Jeffrey
Oak Ridge National Laboratory, Oak Ridge, TN 37831-6169, USA
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UNTERBERG Ezekial
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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BATTAGLIA Devon
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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SHAFER Morgan
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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CANIK John
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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EVANS Todd
General Atomics, San Diego, CA, USA
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MEITNER Steven
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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EVANS Todd
General Atomics
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HARRIS Jeffrey
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
関連論文
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- Soft X-Ray Imaging Design and Analysis Methods on DIII-D