ディフラクトメータによる粗大結晶粒材におけるX線応力測定法 (X線材料強度特集号)

概要

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It has been generally accepted that X-ray stress measurement of very coarse polycrystalline materials is difficult because of their spotty X-ray diffraction patterns. In this paper, we propose to discuss the θ-2θ and the fixed specimen method, and verify experimentally which method is more profitable for measuring stress of the specimen with very coarse grain. The results obtained are as follows: (1) The fixed specimen method is inadequate for coarse polycrystalline materials. (2) By the θ-2θ method it is ultimately possible to measure accurately the stresses on materials having such a large average grain size as 200μ. (3) The experimentally obtained X-ray elastic constants E/(I+ν) are almost invariable for materials having average grain size from 5μ to 120μ.
公益社団法人日本材料学会の論文