電子線ホログラフィー

元データ 日本結晶学会

概要

The new technique of electron holography is reviewed. Using this technique, the phase distribution of an electron beam transmitted through a specimen is observed in the interference electron micrograph. The contour lines that appear can be interpreted as the thickness contours of a homogeneous specimen and as the magnetic lines of force of a ferromagnetic specimen. Several applications and future prospects are presented using this holographic interference method. [J. Cryst. Soc. Jpn. 26, <I>211</I> (1984) ] .

著者

外村 彰 (株) 日立製作所基礎研究所,科学技術振興事業団
外村 彰 日立中研
外村 彰 (株) 日立製作所中央研究所

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