A general on-wafer noise figure de-embedding technique with gain uncertainty analysis
スポンサーリンク
概要
- 論文の詳細を見る
This paper reports a general on-wafer noise figure (NF) de-embedding technique with the analysis of two gain definitions. As implemented in this work, all elements involved in NF measurement were determined and classified as a multi-stage network, and the well-known Friis law is applied to correct the noise contributions coming from other stages. With the two gain definitions, the effects of impedance match on NF are investigated. The result shows an NF of 3.80dB obtained with the de-embedding method and 6.06dB without the de-embedding method. This result is for vector measurement using the available gain, which gives 0.18dB improvement in NF as opposed to scalar measurement utilizing the insertion gain. Furthermore, NF was also measured at 5.63dB, 5.76dB, and 4.75dB under three different source impedances, namely, short, open, and load, respectively.
- The Institute of Electronics, Information and Communication Engineersの論文
The Institute of Electronics, Information and Communication Engineers | 論文
- Compensation Effect of Quasi-Inverse Filter (QIF) on Frequency Characteristic Distortion in Wideband Systems
- Subblock Processing for Frequency-Domain Turbo Equalization under Fast Fading Environments
- Measurement-Based Performance Evaluation of Coded MIMO-OFDM Spatial Multiplexing with MMSE Spatial Filtering in an Indoor Line-of-Sight Environment
- Design of a Multiple-Input SC DC-DC Converter Realizing Long Battery Runtime
- The Influence of a Low-Level Color or Figure Adaptation on a High-Level Face Perception