In situ AFM Observation of Surface Deformation of Polyimide Film
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概要
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The mechanical tensile deformation of Kapton type polyimide (PI) film surface was observed in situ using an atomic force microscope (AFM). From the changes of the AFM images under the loads, the microscopic (5μm×5 μm range), mesoscopic (50μm×50 μm range) and macroscopic (20mm range) surface deformations could be evaluated. The microscopic stress-strain curves with different magnifications were found to coincide one another, which indicates an affine deformation of the PI film. Youngs modulus of PI film was obtained as 1.8 GPa from the initial slope of the stress-strain curve by AFM. The film was found to shrunk in the direction perpendicular to the loading axis, and the apparent Poissons ratio was evaluated as 0.45.
- 一般社団法人 日本レオロジー学会の論文
一般社団法人 日本レオロジー学会 | 論文
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