Estimation of Delay Test Quality and Its Application to Test Generation
スポンサーリンク
概要
- 論文の詳細を見る
As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.
論文 | ランダム
- 20. 床仕上材料に関する研究(第2報)
- 9. 異強度材の組合せによる膠着合成梁の研究(第3報) : その1・使用材料の力学的性質について
- 14. 建築用集成木材に関する研究(第11報) : Butt Jointと曲げ強さとの関係
- 13. 建築用集成木材に関する研究(第10報) : スカーフの傾斜と曲げ強さとの関係
- 12. 建築用集成木材に関する研究(第9報) : スカーフの傾斜と引張強さとの関係