超微粒状γ-Fe2O3におけるX線回折線の半値巾増大に関する解析
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概要
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X-ray line broadening observed on the diffraction pattern of fine grained r-Fe2O3 is analyzed. The integrated intensities and pure half width of the lines determined by computer fitting by the least square approximations on line profiles to Lorenzian form. It is found that for very fine grained r-Fe2O3, the half width of the diffraction lines are dependent on the structure factors: the reflexions from the net planes consisting of O2-, Fe3+ on A-site and/or Fe3+ on B-site are relatively sharp, but those from the net planes consisting of only Fe3+ on A-site or Fe3+ on A-site and B-site are considerably broad. The origin of the X-ray line broadening is discussed.
- 長岡技術科学大学の論文
- 1983-01-31