Simple method of obtaining replicas of selected and rather wide areas in electron microscopic study.

概要

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A simple method of obtaining replicas of selected areas of specimen surface is described. In the method, no specific apparatus other than an usual optical microscope is required as in Fourie's method, in addition, handlings involved are very simple. The method is based on an usual two-stage filmy replica technique, and to observe rather wide area the slit type specimen carrier is employed. The correct positioning of the replica on the specimen carrier is done with ease in a short time. The advantages, disadvantages and applications of the method are also discussed.
長崎大学学芸学部の論文
1963-02-28