On a Contact Failure Prediction and Reliability of Electrical Contacts

概要

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The contact devices are widely used in electrical circuits, and very important. For this reason, they are required high reliability. In this article, we propose a method which predicts a contact failure of electrical contacts and connector contacts. By using an experimental measurements and a numerical simulation of a current collecting under static contact conditions, we clarify a current collecting mechanism in the contact surface. We discuss the factors to generate such contact failure. Especially, we will clarify the relation between the contact failure and the shape of the peripheral part of the contact device. Namely, if the pin has the conic shaped tip, the contact resistance is decreased with time. On the other hand, the pin has the semisphere shaped tip, the contact resistance is increased with time. Based on these facts, we predict the contact failure by using a three layered type artificial neural network system. Also, we discuss the reliability of the electrical contacts.
2010-11-04