F-5 Evaluation of Ferroelectric Domain Boundary by Ultrasonic Atomic Force Microscopy using Lateral Bending Mode(Measurement technique, Imaging, Non-destructive testing (English session))
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概要
- 論文の詳細を見る
- 超音波エレクトロニクスの基礎と応用に関するシンポジウム運営委員会の論文
- 2006-11-15
著者
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Yamanaka Kazushi
Tohoku Univ.
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Tsuji Toshihiro
Tohoku University
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Tsuji Toshihiro
Tohoku Univ. Dept. Mat. Processing
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Kobari Kentaro
Tohoku Univ., Dept. Mat. Processing
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Ide Seishiro
Tohoku Univ., Dept. Mat. Processing
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Yamanaka Kazushi
Tohoku Univ. Dept. Mat. Processing
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Kobari Kentaro
Tohoku Univ. Dept. Mat. Processing
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Ide Seishiro
Tohoku Univ. Dept. Mat. Processing
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- P1-28 Measurement of SAW on a quartz ball with proximate electrodes to improve waveforms of ball SAW device(Poster session 1)
- P2-17 Effect of temperature on the response of ball SAW hydrogen gas sensor(Short oral presentation for posters)
- F-5 Evaluation of Ferroelectric Domain Boundary by Ultrasonic Atomic Force Microscopy using Lateral Bending Mode(Measurement technique, Imaging, Non-destructive testing (English session))
- P2-16 Suppression of spurious vibration of cantilever in ultrasonic atomic force microscopy(Short oral presentation for posters)
- P2-4 Analysis of stress-induced ferroelectric domain structure by ultrasonic atomic force microscopy(Short oral presentation for posters)