Structural analysis of oxide ion conductor, Ba_<2-x>Sr_xIn_2O_5 and Ba_2Ln_<2-x>Ga_xO_5 : Significance of synchrotron X-ray diffraction at high temperatures

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High temperature synchrotron X-ray diffraction measurements have been performed on Ba_<2-x>Sr_xIn_2O_5 and Ba_2In_<2-x>Ga_xO_5, which exhibits two kinds of structural phase transition and high oxide ion conductivity at the high temperature phase. It has been revealed that the synchrotron X-ray diffraction with high sensitivity and resolution is necessary to detect any slight distortion from ideal cubic perovskite in cation substituted Ba_2In_2O_5 system. By using synchrotron X-ray diffraction, the slight distortion from ideal cubic perovskite in Ba_2In_<2-x>Ga_xO_5, which could not be observed by using Cu Kα X-ray diffraction, has been clarified. The larger and smaller distortions have been observed with an increase of Sr and Ga content, respectively, which can be explained from the viewpoint of variation of the tolerance factor.
社団法人日本セラミックス協会の論文
2009-01-01