The Measurements of the Secondary Ion Emissions on the Charge State of Fast Ions and Clusters(Atomic and molecular physics)

概要

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A sample for studying secondary ion emissions was made by pressing powders of carbon nanotubes with purity of 98%. The emission yields of different species of atoms/molecules are measured by using a conventional time of flight (TOF) technique under bombardments of C^<+q>, Si^<+q> (q=1-6), and Ni^<+q> (q=1-5), C_2^<+q>, Si_2^<+q> (q=1,3,5), and Ni_2^<+q> (q=3,5), C_3^<+q>, Si_3^<+q>, and Ni_3^<+q> (q=2,4) with energy of 1.5 MeV per atom, respectively. With increasing charge states of the projectiles, the secondary ion emission yields per projectile increase and q^3-dependence are observed. The size and the charge state of the clusters are larger, the secondary ion emissions are more enhanced. The electronic process plays an important role in secondary ion emissions under fast projectile bombardments.
社団法人日本物理学会の論文
2008-03-15