放射光蛍光X線分析法による加熱及び非加熱板ガラス中の微量不純物分析と法科学的異同識別への応用(<特集>安心と安全に役立つ分析化学)

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The application of trace impurity analysis using synchrotron radiation X-ray fluorescence spectrometry (SR-XRF) was investigated for the forensic discrimination of heated and non-heated sheet glasses. Each of 5 sheet glasses produced by 3 domestic manufacturers was divided into 2 groups, one of which was subjected to RI measurement and elemental analysis by SR-XRF after heating at 764℃ for 2 minutes while the other was without heating. All of the heated glasses provided lower RI values than those of non-heated ones. The difference in RI between the heated and non-heated glasses, ranged from 0.0012 to 0.0015, which was 6〜7 times larger than the variation of RI within a pane of sheet glass. As a result of the elemental analysis of 5 non-heated glasses by SR-XRF, the X-ray intensities of impurity elements, such as Rb, Sr, Zr, Ba, La and Ce, were found to be considerably different among the different glasses. All of 10 pairs among 5 non-heated glasses could be successfully discriminated by comparisons of 4 kinds of X-ray intensity ratios (SrKα/RbKα, ZrKβ/RbKα, BaKα/CeKα, LaKα/CeKα). No significant difference was recognized between the analytical results of the non-heated glasses and those of heated ones by the t-test with a significance level of 1%. It is concluded that trace impurity analysis using SR-XRF is useful for the correct discrimination of heated and non-heated glass fragments, whereas the comparison of only RI can result in false differentiation.
2007-12-05

放射光蛍光X線分析法による加熱及び非加熱板ガラス中の微量不純物分析と法科学的異同識別への応用(<特集>安心と安全に役立つ分析化学)

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