Phase Retrieval Microscope Based on Photon Image Detection

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概要

• 論文の詳細を見る

• The accuracy and sensitivity of the phase retrieval from a Fraunhofer diffraction pattern greatly depend on the dynamic range of the measured Fraunhofer diffraction pattern. In this study, a photon-imaging detector was adopted to detect higher order diffraction spots of a very weak phase grating. The phase retrieval was accomplished fairly well experimentally from the Fraunhofer diffraction intensity distribution data including up to the third-order diffraction spots to which the iterative Fourier transform algorithms were applied. The object phase distribution was retrieved with satisfactory accuracy and sensitivity. A newly introduced procedure for measuring the entire diffraction pattern with single photon-imaging detector is also described.

• 社団法人応用物理学会の論文
• 2002-07-30

著者

• KOMATSU Shinichi

  Department of Hygiene, School of Medicine, University of Gunma

• NAKASHIMA Yusuke

  Department of Chemistry, Graduate School of Science, Tokyo Metropolitan University

• Hattori Masayuki

  Advanced Research Center For Science And Engineering Waseda University

• Nakashima Yusuke

  Department Of Applied Physics. School Of Science And Engineering Waseda University

• Komatsu Shinichi

  Department Of Applied Physics. School Of Science And Engineering Waseda University:advanced Research

• Komatsu Shinichi

  Department Of Applied Physics School Of Science And Engineering Waseda University

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