227 ANALYSIS OF INFLUENCE THAT STRONG MAGNETIC FIELD ENVIRONMENT CAUSES TO NOISE MEASUREMENT SYSTEM(General Session IV)
スポンサーリンク
概要
- 論文の詳細を見る
The MRI examination is necessary and indispensable in the medical diagnosis. The generated operation sound is large at the image obtaining. The testee is pointing out dissatisfaction of it. The A-weighted sound pressure level of the sound is called 100dBA or more. This examination room was a strong magnetic field environment, and the noise level was not investigated enough. The reason is that measuring instrument breaks down when approaching the MRI device to measure it. In this report, the analysis result of the influence that the strong magnetic field causes to non-magnetic microphone for the noise measurement is shown. We measured the sound of MRI of GE Yokogawa medical system LTD. "SIGNA HORIZONLX 1.5T". It has the gradient magnetic field of 22mT/m or less. We estimated the influence that the magnetic field gave the microphone with -97dBV. This value is a small from microphone electromotive force -35dBV in the noise level 94dB. The noise levels at some image obtaining were measured with this device. The maximum noise level of slice positioning was 103dB(A). The A-weighted sound pressure level on the patient table of slice positioning is as same as the level of T2W.
- 一般社団法人日本機械学会の論文
- 2005-05-31
著者
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YAGI Kazuo
Department of Mechanical Engineering, Mie University
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Yagi Kazuo
Department Of Health Science Tokyo Metropolitan University Of Health Science University
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Eguchi Kentaro
Department Of Health Science Tokyo Metropolitan University Of Health Science University
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TAKANO Kunihiko
Tokyo Metropolitan College of Industrial Technology
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Muto Kenji
Tokyo Metropolitan college of Industrial Technology
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TAKANO Kunihiko
Department of Electronic Engineering, Tokyo Metropolitan College of Aeronautical Engineering
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Takano Kunihiko
Department Of Electronic Engineering Tokyo Metropolitan College Of Aeronautical Engineering
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Takano Kunihiko
Department Of Electrical Engineering Shonan Institute Of Technology
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MUTO Kenji
Department of Electronic Engineering, Tokyo Metropolitan College of Aeronautical Engineering
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