Development of a Roundness Profile Measurement System for Parallel Rollers Based on a V-Block Method

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概要

• 論文の詳細を見る

• Cross-section roundness profile measurement is generally considered a significant procedure in the processing of parallel rollers requiring the highest quality in dimensional accuracy.This becomes a difficult procedure due to the fact that such rollers show extremely small dimensional error, resulting in expensive and time consuming measuring methods or, in most cases, the ignorance of the procedure itself.This report deals with the development of a roundness measurement system for high-precision parallel rollers based on a V-block double enlargement device.The measuring principle of the V-block method is described, followed by details of our proposed double enlargement device.Cross-section profile measurements are conducted on JISP1 grade parallel rollers, and these results are further compared to results obtained from a contemporary radius measurement method to demonstrate the validity of the device for such application.

• 一般社団法人日本機械学会の論文
• 1999-06-15

著者

• HAYASHI Akira

  Nano Corpeoration

• Goho Kenji

  Matsushita Research Institute Tokyo

• MITUI Kimiyuki

  Keio University Faculty of Science and Technology Department of Mechanical Engineering

• Hayashi Akira

  Nano Corporation

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• Development of a Roundness Profile Measurement System for Parallel Rollers Based on a V-Block Method

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