Loss Reduction of GeO_2-Doped Silica Waveguide with High Refractive Index Difference by High-Temperature Annealing
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概要
- 論文の詳細を見る
The effect of a GeO_2-doped core on high-temperature annealing has been investigated to reduce the propagation loss of a waveguide device with high refractive index difference(Δ). A SiO_2-GeO_2 waveguide core was prepared on a fused silica substrate by rf magnetron sputtering and reactive ion etching. With increasing the annealing temperature, the roughness of the core side-wall gradually disappears and the rectangular core gradually becomes rounded. The effect of smoothing and rounding the cores was a significant reduction of the scattering loss, and moreover, it enabled the complete embedding of narrow gaps between cores in cladding glass using conventional plasma chemical vapor deposition. The propagation loss of the waveguide with a Δ of 1.5% was 0.07dB/cm at 1.55μm wavelength, the effect of which was demonstrated in the fabrication of an arrayed-waveguide grating demultiplexer.
- 社団法人応用物理学会の論文
- 2000-06-01
著者
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OKANO Hiroaki
Optoelectoronic System Laboratory, Hitachi Cable, Ltd.
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TAKEUCHI Manabu
Graduate School of Materials Science, Nara Institute of Science and Technology
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Okano H
Hitachi Cable Ltd. Ibaraki Jpn
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Takeuchi Manabu
Graduate School Of Science And Engineering Ibaraki University
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KASHIMURA Seiichi
Graduate School of Science and Engineering, Ibaraki University
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MARU Koichi
Optoelectronic System Laboratory, Hitachi Cable Ltd.
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Maru Koichi
Optoelectronic System Laboratory Hitachi Cable Ltd.
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Kashimura Seiichi
Graduate School Of Science And Engineering Ibaraki University
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