Virtual Space Charge Model for a Frequency-Based Characterization of Insulators : Electrical Properties of Condensed Matter

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概要

• 論文の詳細を見る

• As insulators are stressed with a strong electric field, they store electric charges that can be represented as space charge dis-tributions. We propose a simple equivalent model of these distributions in order to characterize the internal residual field in a thin polymeric insulator using a frequency-based technique called focused laser intensity modulation method (FLIMM). This approach shows its ability to follow simple evolutions resulting for example from an increasing of stressing field or of the poling duration time, avoiding in a first approximation the use of complex mathematical algorithms.

• 社団法人応用物理学会の論文
• 2001-08-15

著者

• Franceschi Jean-luc

  Laboratoire De Genie Electrique Cnrs Universite Paul Sabatier

• MARTY-DESSUS Didier

  Laboratoire de Genie Electrique, Universite Paul Sabatier

• BIELLMANN Cedrick

  Laboratoire de Genie Electrique CNRS, Universite Paul Sabatier

• BERQUEZ Laurent

  Laboratoire de Genie Electrique CNRS, Universite Paul Sabatier

• Berquez L

  Univ. Paul Sabatier Toulouse Fra

• Biellmann Cedrick

  Laboratoire De Genie Electrique Cnrs Universite Paul Sabatier

• Marty-dessus Didier

  Laboratoire De Genie Electrique Cnrs Universite Paul Sabatier

• Marty-Dessus Didier

  Laboratoire de Génie Electrique, Université Paul Sabatier, 118 Route de Narbonne, Toulouse 31062, France

関連論文

• A Comparison of Different Mathematical Treatments for Solving the Inverse Problem in Focused Laser Intensity Modulation Method
• Virtual Space Charge Model for a Frequency-Based Characterization of Insulators : Electrical Properties of Condensed Matter
• Defect Detection in Silicon Wafer by Photoacoustic Imaging
• A Comparison of Different Mathematical Treatments for Solving the Inverse Problem in Focused Laser Intensity Modulation Method

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