Relation between the Radius of Tip Curvature and the Light Emission Efficiency from Scanning Tunneling Microscope
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概要
- 論文の詳細を見る
The relation between the efficiency of scanning tunneling microscope light emission(STM-LE)and the radius of tip curvature has been studied using silver tips.The emission efficiency increases with decreasing radius of tip curvature ρ for ρ > 80nm.This result agrees qualitatively with the prediction of a theory that includes the effect of electromagnetic retardation.
- 社団法人応用物理学会の論文
- 2000-08-15
著者
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Uehara Y
Advanced Technology R&d Center Mitsubishi Electric Corp. Department Of Chemistry Faculty Of Scie
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Uehara Yoichi
Research Institute Of Electrical Communication Tohoku University
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Iwami Masayuki
Research Instutute Of Electrical Communication Tohoku University And Crest Japanscience And Technolo
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USHIODA Sukekatu
Research Instutute of Electrical Communication, Tohoku University, and CREST, JapanScience and Techn
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Uehara Yoichi
Research Instutute Of Electrical Communication Tohoku University And Crest Japanscience And Technolo
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Uehara Yoichi
Research Institute Of Electrical Communication Tohokn University
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Ushioda Sukekatu
Research Instutute Of Electrical Communication Tohoku University And Crest Japanscience And Technolo
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