X-Ray Diffraction Profiles for Near 180°Scattering from Mosaic Crystals : Techniques, Instrumentations and Measurement
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概要
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Reflectivity curves have been calculated for mosaic crystals in the case of normal-incidence Bragg diffraction with soft X-rays. The enormously broadened angular width of a reflection when the angle of incidence to the reflecting Bragg plane approaches 90°allows a single crystal with a mosaic spread as much as a few degrees to give a reflectivity profile very similar to that of a perfect crystal, when the incident photon energy is scanned. The insensitivity of the diffraction process to crystal mosaicity can be exploited in standing-wave experiments aimed at the determined of substrate overlayer interface structures.
- 1988-08-20
著者
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HASHIZUME Hiroo
Research and Education Center for Materials Science, Nara Institute of Science and Technology
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Nakahata Takumi
Research Laboratory Of Engineering Materials Tokyo Institute Of Technology
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Hashizume Hiroo
Research And Education Center For Materials Science Nara Institute Of Science And Technology
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