Crystal Structure and Madelung Potential in R_<2-x>Ce_xCuO_<4-δ> (R=Pr, Nd, Sm, Eu and Gd) System

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Powder X-ray diffraction measurements were taken in the R_<2-x>Ce_xCuO_<4-δ> (R=Pr,Nd,Sm, Eu and Gd) system. Rietveld refinement of these structures was performed assuming that the space group was 14/mmm. The lattice constant and rare earth metal location were determined to study the electrostatic effects of T'-phase materials. We found that the difference in the Madelung site potential, ?V (V_R-V_<Cu>), as well as T_c has a peak for the Cu-O bond length. These data suggest that the carrier concentration is not constant in T'-phase materials and that changes in the carrier concentration influence T_c in these materials.
社団法人応用物理学会の論文
1991-06-01