Composition-Dependent Appearance of Amorphous Phase in ZnS_xO_<1-x> System and its Stability

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概要

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• ZnS_xO_<1-x>(x>0.3) films were prepared by r.f. sputtering of ZnS powder. This ZnS_xO_<1-x> is amorphous in the range 0.3 < x < 0.5, and is a mixture of amorphous and crystalline phases in the range x > 0.5. The x-dependence of the amorphous phase is thought to be due to a large difference in the bond length between Zn-S and Zn-O. The amorphous structure has been found to be fairly stable. No X-ray diffraction line was observed after annealing at 400℃, though optical and electrical properties changed markedly. X-ray diffraction and photoluminescence properties have indicated that the photoluminescence is attributable to the amorphous structure.

• 社団法人応用物理学会の論文
• 1986-06-20

著者

• IIDA Seishi

  Department of Electrical Engineering, Technological University of Nagaoka

• Iida Seishi

  Department Of Electrical Engineering The Technological University Of Nagaoka

• Iida Seishi

  Department Of Electrical Engineering Nagaoka University Of Technology

• TAKABAYASHI Akiharu

  Department of Electrical Engineering, The Technological University of Nagaoka

• Takabayashi Akiharu

  Department Of Electrical Engineering The Technological University Of Nagaoka:(present Address)va Pro

関連論文

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• Raman Scattering and Two-Phonon Infrared Transmission Spectra of Cu(Al_xGa_)S_2 Crystals
• Deep Region Emissions of CuGaS_2 Crystals
• Picosecond Time-Resolved Spectroscopy of Exciton Systems in CuGaS_2 Bulk Single Crystals
• Composition-Dependent Appearance of Amorphous Phase in ZnS_xO_ System and its Stability

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