Superconducting Critical Current Densities of Sputter-Deposited Nb_3Ge Films
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概要
- 論文の詳細を見る
Critical current densities J_c of sputter-deposited Nb_3Ge films with thicknesses of less than 1 μm have been measured in applied fields either parallel or normal to the film plane. Current densities in the 10^5 A/cm^2 range are obtained in a parallel field of 15 T. A film with the highest J_c consists of regular fine grains of 〜1000 Å in columnar diameter. J_c's of thicker films where A-15 grains with different sizes are observed are relatively low.
- 社団法人応用物理学会の論文
- 1983-05-20
著者
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OUCHI Hiroyuki
Department of Biopharmaceutics, School of Pharmacy, Tokyo University of Pharmacy and Life Science
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Suzuki Mitsumasa
Department Of Electrical Engineering Faculty Of Engineering Tohoku University
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ANAYAMA Takeshi
Department of Electric Engineering, Tohoku University
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Ouchi Hiroyuki
Department Of Electrical Engineering Faculty Of Engineering Tohoku University
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Anayama Takeshi
Department Of Electric Engineering Tohoku University
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