Simple Measurement of the Reflectivity of Antireflection-Coated Laser Diode Facets : Waves, Optics and Quantum Electronics

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概要

• 論文の詳細を見る

• A laser diode facet reflectivity measuring method which uses the threshold current ratio of an antireflection coated to an uncoated laser is proposed. The method's measuring characteristics are determined and compared with those of conventional methods. The proposed method is simpler, easier and more accurate than conventional methods, such as the two-facet power ratio method and the spectrum modulation index method even for low facet reflectivities.

• 社団法人応用物理学会の論文
• 1988-06-20

著者

• Ukita Hiroo

  Ntt Applied Electronics Laboratories

• Katagiri Yoshitada

  Ntt Applied Electronics Laboratories

• MISE Keisuke

  NTT Applied Electronics Laboratories

関連論文

• Simple Measurement of the Reflectivity of Antireflection-Coated Laser Diode Facets : Waves, Optics and Quantum Electronics
• Improvement in Signal-to-Noise Ratio of a Longitudinally Coupled Cavity Laser by Internal Facet Reflectivity Reduction : COMPONENTS

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