Angular Dependence of the Upper Critical Field of La_<1.85>Sr_<0.15>CuO_4 Single-Crystal Thin Films

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概要

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• Resistive transition curves of a La_<1.85>Sr_<0.15>CuO_4 single-crystal thin film have been measured for various magnetic fields and angles between the CuO plane and the field. Using the mean-field approach to determine T_c(H), the upper critical field H_<c2> and its angular dependence are estimated. For the magnetic fields parallel and perpendicular to the CuO plane, values for dH^&paqrsi;_<c2>/dT = - 11.8T/K and dH^⊥_<c2>/dT = - 1.0T/K are obtained, resulting in an anisotropy factor of 12. The angular dependence of dH_<c2>/dT is explained well by the effective mass model. The Ginzburg-Landau coherence lengths are 32 Å in the CuO plane and 2.7 Å in the c-axis direction.

• 社団法人応用物理学会の論文
• 1989-09-20

著者

• SUZUKI Minoru

  NTT Opto-Electronics Laboratories

関連論文

• Anomalous Field-Induced Resistive Transition in La_Sr_xCuO_4
• Nonbolometric Infrared Detection in La_Sr_xCUO_4 and YBa_2Cu_3O_y Epitaxial Thin Films
• Angular Dependence of the Upper Critical Field of La_Sr_CuO_4 Single-Crystal Thin Films

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