Growth of High-Quality AlN, GaN and AlGaN with Atomically Smooth Surfaces on Sapphire Substrates
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概要
- 論文の詳細を見る
Metalorganic chemical vapor deposition (MOCVD) growth of AlN, GaN and AlGaN on sapphire substrates was investigated, with the aim of realizing high-quality heterostructures with atomically smooth interfaces. AlN with surfaces constructed of single-atomic-layer steps was grown by the two-step growth technique, in which the thin first layer was grown at a low temperature (1250℃) and then the second layer was grown at a high temperature (1350℃). GaN with surfaces consisting of simple atomic-layer steps were successively grown on the AlN layer by optimizing the growth conditions. Marked degradation of surface flatness was not observed for Al_<0.2>Ga_<0.8>N growth on GaN.
- 社団法人応用物理学会の論文
- 1997-12-01
著者
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Ohba Yasuo
Research And Development Center Toshiba Corporation
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YOSHIDA Hiroaki
Research and Development Center, Toshiba Corporation
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Sato Rie
Research And Development Center Toshiba Corporation
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Yoshida Hiroaki
Research And Development Center Toshiba Corporation
関連論文
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- Modulation-Doped In_Al_P/GaAs Field-Effect Transistors : Semiconductors and Semiconductor Devices
- H-Atom Incorporation in Mg-Doped GaN Grown by Metalorganic Chemical Vapor Deposition
- Growth of High-Quality AlN, GaN and AlGaN with Atomically Smooth Surfaces on Sapphire Substrates
- Growth of High-Quality AlN and AlN/GaN/AlN Heterostructure on Sapphire Substrate