Microstructure and Microwave Properties of Tl_2Ba_2CaCu_2O_8 Thin Films on CaNdAlO_4(001)

概要

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High-quality epitaxial Tl_2Ba_2CaCu_2O_8 sperconducting thin films have been grown on CaNdAlO_4 (001) substrates by a two step process. Analysis results from secondary ion mass spectroscopy and X-ray energy dispersive spectroscopy of a film annealed at 850℃ indicated non-uniform Nd and Ca interdiffusion from the substrate in to the film. A second film, annealed at 800℃, exhibited better superconducting properites with T_c of 100.7 K, transition width of 2.5 K, and J_c of 3.5×10^5 A/cm^2 at 77 K. Microwave measurement at 77 K of a 2.3 GHz microstrip resonator made from the 800℃ annealed film on a CaNdAlO_4 substrate exhibited a low power Q of 2,100.
社団法人応用物理学会の論文
1991-04-15