Submicron-Scale Tip Fabrication for Magnetic Force Microscopy by Electrolytic Polishing

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概要

• 論文の詳細を見る

• An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be below-submicron scale. Magnetic force imaging of recorded magnetic tape using these tips is shown.

• 社団法人応用物理学会の論文
• 1988-08-20

著者

• Yasuda Kyosuke

  Ntt Applied Electronics Laboratories

• Iijima Tetsuo

  Ntt Applied Electronics Laboratories

関連論文

• Submicron-Scale Tip Fabrication for Magnetic Force Microscopy by Electrolytic Polishing

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