Crystallization of Amorphous Zr-20 at % Ni Alloy : Condensed Matter
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概要
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The crystallization process of an amorphous Zr_<80>Ni_<20> alloy was investigated by X-ray diffractometry, electrical resistivity measurement and differential scanning calorimetry (DSC). The resistivity (at 300 K) of amorphous ribbon used in this experiment was 1.7 × 10^2 μΩ・cm. The temperature coefficient of resistivity was -1.04 × 10^<-4>/K, in the region between 300 and 370 K. The crystallization temperature determined by resistivity measurement was 615 K. The activation energies for the crystallization were found to be 2.4 eV from the resistivity data and also 2.5 eV from DSC data. A time-temperature-transformation (T-T-T) diagram consisting of two straight lines was obtained.
- 社団法人応用物理学会の論文
- 1988-06-20
著者
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Miyashita Akira
Department Of Applied Chemistry Faculty Of Engineering Saitama University
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ASAHI Nobuo
Department of Physics, Faculty of Science and Technology, Science University of Tokyo
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Asahi Nobuo
Department Of Physics Faculty Of Science And Technology Science University Of Tokyo
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- Crystallization of Amorphous Zr-20 at % Ni Alloy : Condensed Matter