Temperature Dependence of PHB Hole Profiles in Polymer Matrices

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概要

• 論文の詳細を見る

• The temperature dependencies of irreversible hole decay for tetraphenylporphines / polymers as guest / host systems were investigated. The irreversible hole decay values depend on the chemical structure of matrix polymers. Irreversible hole decay is caused by the motion of polymer side chains or backbones of poly(alkyd methacrylate)s and polyethylene. Excellent hole retention is observed in the PMMA matrix, and is explained by the small, symmetrical structure of methyl groups. PnDMA shows hole decay profiles similar to those of PE. This result indicates that PnDMA forms microstructures that are similar to PE microstructures because of long methylene side chains.

• 社団法人応用物理学会の論文
• 1988-02-20

著者

• Tabei Hisao

  Ntt Electrical Communications Laboratories

• Nishi Toshihiro

  Ntt Electrical Communications Laboratories

• ARISHIMA Koichi

  NTT Electrical Communications Laboratories

• HIRATUKA Hiroaki

  NTT Electrical Communications Laboratories

関連論文

• Direct Patterning and Electrical Properties of Phthalocyanines Thin Films Prepared by Langmuir-Blodgett and Spin Cast Techniques
• Direct Pattern Fabrication of Substituted Phthalocyanine Films
• Temperature Dependence of PHB Hole Profiles in Polymer Matrices

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