Far-Infrared Reflectance Study of Coupled Longitudinal-Optical Phonon-Hole Plasmon Modes and Transport Properties in Heavily Doped p-Type GaAs
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概要
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We measured room-temperature far-infrared reflectance spectra of ten p-type, Be-doped, molecular-beam-epitaxy-grown GaAs films with hole densities from 6.3×10^<17> to 2.9×10^<19>cm^<-3> and examined the frequency-dependent dielectric function of coupled phonon-heavily damped hole plasmon modes in these samples without the complications that arise in Raman scattering experiments. Both a two-oscillator dielectric function ε(ω), and Kukharskii's factorized form ε_K(ω) for the dielectric function, reproduce the data well. The plasmon-like modes clearly appear in the reflectance spectra, although they are suppressed in the Raman spectra, and we find that their frequencies are best given by finding the solutions of ε(ω)=0 in the complex ω-plane. The infrared data also accurately yield the hole drift mobilities when we consider values for the Hall scattering factor in p-type GaAs.
- 社団法人応用物理学会の論文
- 1997-09-15
著者
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SAKAI Kiyomi
Kansai Advanced Research Center, National Institute of Information and Communications Technology
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Sakai Kiyomi
Kansai Advanced Research Center Communication Research Laboratory
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Sakai Kiyomi
Kansai Advanced Research Center Communications Research Laboratory Ministry Of Posts And Telecommuni
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FUKASAWA Ryoichi
Kansai Advanced Research Center, Communications Research Laboratory, Ministry of Posts and Telecommu
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PERKOWITZ Sidney
Department of Physics, Emory University
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Perkowitz Sidney
Department Of Physics Emory University
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Fukasawa Ryoichi
Kansai Advanced Research Center Communications Research Laboratory Ministry Of Posts And Telecommuni
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