Characterization of Spray Pyrolysed CdS Thin Film Doped with Cu
スポンサーリンク
概要
- 論文の詳細を見る
Spray pyrolysed CdS thin film have been converted into p-type by diffusing Cu atoms for the first time. Copper atoms diffuse into CdS film when Cu/CdS bilayer system is annealed. The hot probe and Hall effect studies show that the n-type CdS film is converted into p-type. The resistivity of these films is quite high at low Cu concentration while further addition of Cu causes a drastic decrease in the resistivity value. The X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS) and optical absorption studies show that Cu merely diffuses into CdS and does not form any chemical reaction with sulphur to form new compounds. The Variable Angle Spectroscopic Ellipsometric (VASE) studies confirm the diffusion of copper into CdS and also shows that the Cu atoms diffuse 〜500 nm into CdS due to annealing at 350℃.
- 社団法人応用物理学会の論文
- 1995-09-15
著者
-
Mukerjee P.
Regional Research Laboratory
-
Vijayakumar K
Cochin Univ. Sci. And Technol. Cochin Ind
-
Vijayakumar K.
Department Of Physics Cochin University Of Science And Technology
-
MATHEW Sunny
Department of Physics, Cochin University of Science and Technology
-
Mathew Sunny
Department Of Physics Cochin University Of Science And Technology
関連論文
- Characterization of Spray Pyrolysed CdS Thin Film Doped with Cu
- Fabrication of Homojunction Using Spray Pyrolised CdS Thin Film by Copper Diffusion